Features Release 20170323
Input Data Formats
STDF, ATDF  
NI-CSV, generic CSV, others  
WAT (fab parameters)  
Open Compressed (GZip) versions of any of the above  
Merge data files of any of the above types  
Link to existing database  
Tester DataStream (real-time)
RITdb
Session Processing
Reopen a saved session to restore settings and parameters  
Overlay a previously created Session onto new, similar data  
Save setup and configuration information, including:
    Tests of interest (hide irrelevant tests)  
    Custom and standard DataSets (groups of records)  
    TestSets (groups of tests)  
    Report information, such as graphs and tables of interest  
    All graph and table configurations  
    Package database files for easy sharing  
Session Save/Restore screen, allow for selection of Session parameters  
Configurable Properties, customize the look/feel for every Session  
Processing information (Process View)
Batch Information (number of records, active sites, etc.)  
File information (lot, processing, tester, etc.)  
High-level processing settings, enable automatic DataSet generation  
Batch Information (number of records, active sites, etc.)  
Processing warnings for:
    Quick list of failing tests  
    Duplicate test numbers  
    Quick list of failing tests  
    Quick list of tests w/ alarms  
    Tests with no limits  
    Tests with zero standard deviation  
Tests with Cpk below adjustable threshold  
Interactive Demos for showcasing features and capabilities  
Report Generation (Report View)
Preview report contents, quickly jump back to graph/table  
Organize and edit report properties before saving/printing  
Report Formats:
    XLS, XLSX  
    PDF  
    CSV
    HTML  
Save images as:
    PDF  
    GIF  
    JPG  
    PNG  
Report Builder screen, allow for quick selection of charts, graphs  
Report Slideshow, iterate through each Report Item  
Table Reports (Table View)
Order, hide, and arrange any column in any table view  
Multiple table views (Statistics, Values, Tests, Comparison, Analysis)  
Statistics Tables, configurable with any of the following:
    Test Info: name, number, DataSet, Limits, Units  
    Run Parameters: total runs, passes, fails, % pass, %fail  
    Statistics: mean, std. deviation, min, max, median, quartiles, IRQ  
    Limit Recommendations: +/-3, 6, 9 std. deviations, Tukey limits  
    Outlier removal information  
    Add custom columns containing any calculation (Custom Statistic)  
Test Tables, allows for editing and manipulating test information
    Configure visible tests (Hide unwanted tests in all other views)  
    Create new test limits, outlier limits, view limits  
    Modify test names  
    Group tests into TestSets  
    Add custom Test consisting of any calculation, value, etc (Custom Test)  
Values Tables, display and manipulate raw test data
    View/compare raw test values  
    View/group sets of values  
Histograms (Histo View)
Multiple graph formats (Stacked, Adjacent, Expanded, and Individual)  
View multiple Tests and DataSets on same graph  
Group sets of tests into TestSets  
Select any grouping of DataSets, TestSets  
Remove/Include Outliers  
Drag/release to zoom in on any part of graph  
Select regions and view, select, or group into DataSets  
Overlay Box plots, CDF Curves  
View local table of statistics, including cumulative stats for given view  
Set the layout of multiple graphs (tile, cascade, overlay)  
Adjustable scale (values, limits, std. dev, outlier/view limits)  
Set number of histogram bins  
Display details like normal curve, mean/median/sigma lines  
Swap Y axis and color axis details (DataSets, Tests)  
Configure all colors for DataSets and Tests  
Configure and move graph titles and details  
Change the size and shape of X and Y axis  
Trend Charts (Trend View)
Multiple graph formats (Stacked, Expanded, and Individual)  
View multiple Tests and DataSets on same graph  
Group sets of tests into TestSets  
Select any grouping of DataSets, TestSets  
Remove/Include Outliers  
Drag/release to zoom in on any part of graph  
Select regions and view, select, or group into DataSets  
View local table of statistics, including cumulative stats for given view  
Set the layout of multiple graphs (tile, cascade, overlay)  
Adjustable Y scale (values, limits, std. dev, outlier/view limits)  
Adjustable X scale (by record, by order, by run)  
Display details like mean/median/sigma lines  
Swap Y axis and color axis details (DataSets, Tests)  
Configure all colors for DataSets and Tests  
Configure and move graph titles and details  
Change the size and shape of X and Y axis  
Scatter Plots (Scatter View)
Multiple graph formats (Stacked and Individual)  
Plot single Test or DataSet to multiple Tests and DataSets  
View multiple Plots on same graph  
Remove/Include Outliers  
Drag/release to zoom in on any part of graph  
Select regions and view, select, or group into DataSets  
View local table of statistics, including cumulative stats for given view  
Set the layout of multiple graphs (tile, cascade, overlay)  
Adjustable X & Y scale (values, limits, std. dev, outlier/view limits)  
Display details like mean/median/sigma lines  
Display Linear Regression Statistics & References  
Configure all colors for DataSets and Tests  
Configure and move graph titles and details  
Change the size and shape of X and Y axis  
Bin Paretos (Bin View)
View Paretos by Soft Bin, Hard Bin, First Failed Test, and Test Value  
Plot Pareto by DataSet (Site, Wafer, Custom)  
View multiple Plots on same graph  
Drag/release to zoom in on any part of graph  
Select regions and view, select, or group into DataSets  
View local table of Bin statistics  
Set the layout of multiple graphs (tile, cascade, overlay)  
Jump to raw data records for any bin type  
Bin and view Test Values by distance from mean (std. deviation)  
Bin and view Test Values using histogramming  
Configure all colors for all Bin types  
Configure and move graph titles and details  
Change the size and shape of X and Y axis  
Wafer Maps (Bin View)
View Wafer maps by Soft Bin, Hard Bin, First Failed Test, and Test Value  
Plot Wafer maps by DataSet (Site, Wafer, Custom)  
View multiple Plots/Wafers on same graph  
Drag/release to zoom in on any part of graph  
Select regions and view, select, or group into DataSets  
View local table of Bin statistics  
Set the layout of multiple graphs (tile, cascade, overlay)  
Overlay Test Values by distance from mean (std. deviation)  
Overlay Test Values using histograms  
Jump to raw data record for any dice  
View retested Dice  
Configure all colors for all Bin types  
Configure and move graph titles and details  
Change the size and shape of X and Y axis  
Lot Maps (Bin View) –  plot bin and test data by site vs. run and more
View Lot maps by Soft Bin, Hard Bin, First Failed Test, and Test Value  
Plot Wafer maps by DataSet (Site, Wafer, Custom)  
View multiple Plots on same graph  
Drag/release to zoom in on any part of graph  
Select regions and view, select, or group into DataSets  
View local table of Bin statistics  
Set the layout of multiple graphs (tile, cascade, overlay)  
Overlay Test Values by distance from mean (std. deviation)  
Overlay Test Values using histograms  
Jump to raw data record for any run  
Configure all colors for all Bin types  
Configure and move graph titles and details  
Change the size and shape of X and Y axis  
Data Manipulation (Record View)
Group data records into custom DataSets  
Select records by Site, Wafer, File, Fails, Retest, more  
Change data File parameters (file ID tags, DataSet colors)  
Globally remove all failing records  
User configurable Device Id, can be set to many different parameters  
Reconstruct Wafer maps from final test data  
Easily sort, group, and view all Bin, Wafer, Serial number data  
Exclude individual records  
Create new test limits, outlier limits, view limits  
Set good/bad Cpk threshold  
Change Test Names  
Select Records by Test, based on equations and value ranges
Data Analysis/Comparison
Quick Outlier Detection and Removal  
Wizard and Advanced Setup Interface for all Comparison Functions  
Compare DataSet to DataSet for any statistical value (mean, std. dev, Cpk, more) using the following:
    Difference  
    % Difference  
    % Difference of Limits Variation  
    Independent T-Test  
    Paired T-Test  
    Linear Regression  
    Highlight results of comparisons relative to adjustable threshold  
    Exponential Regression
    Exclude extreme values (infinity, zero, etc.)  
Compare Test to Test for any statistical value (mean, std. dev, Cpk, more) using the following:
    Difference  
    % Difference  
    % Difference of Limits Variation  
    Independent T-Test  
    Paired T-Test  
    Linear Regression  
    Highlight results of comparisons relative to adjustable threshold  
    Exponential Regression
    Exclude extreme values (infinity, zero, etc.)  
Compare Record to Record for value, pass/fail result, alarm status using the following:
    Difference  
    % Difference  
    % Difference of Limits Variation  
Analyze Spec Limits and recommend Statistically-based limits  
Gage R & R process and analysis capabilities  
Add Custom Statistic, insert custom calculation into any Table  
Add Custom Test insert custom calculation into any Table  
Control Panel
Allows for many different configurations and custom adjustments  
Undock to utilize more table/graphic real estate  
Consistent controls across most views, learn once/apply over and over  
Controls also accessible through context-sensitive popups (right-click menu)  

Process View

Demo Mode

Record View

Create DataSet

Table View, Statistic View

Table View, Raw Data View

Table View, Test Information View

Bin View, Bin Paretos




Bin View, Lot Maps

Bin View, Wafer Heat Map

Bin View, Wafer Variance Map

Histo View, Multi-Graph

Histo View, Stacked Graph Style

Histo View, CDF and Box Plots

Histo View, Overlay Graph Style

Trend View

Trend View, Stacked View

Scatter View

Scatter View, Multiple Independent Variables

Report View

Report View, Test Select Tab

Report View, Report Builder

Report View, Thumbnails

Slide Show

Report Builder

Compare DataSets

Compare Tests

Compare Records

Gage R&R Wizard

Create Custom Statistic

Create Custom Test

Quick Screen Outliers

Delete Custom Statistic or Test

Analyze Limits

Control Panel, Test Selection

Control Panel, DataSet Selection

Control Panel, Setting

Create Custom Spec Limits

Edit Device Parameters

Modify Test Names

Create TestSets

License Manager

Properties