VectorPort is a powerful and versatile test development tool for converting WGL or STIL test vectors into targeted, production ATE test patterns. Quickly generate patterns, pinmaps, and timing data for most ATE platforms. Easily turn your Scan ATPG files into production-ready tests. Add or remove signals, modify timing, and more with the graphical pin and timing editors. View signal waveforms and timing relationships with the WGL and STIL waveform viewer. Several ATE-specific options allow for smooth integration with your test development environment.


Use the graphical interface to select, edit, and configure the conversion process or select the command-line interface for scripting and batch processing. The push-button conversion process requires little or no training and has been optimized for speed and low memory usage. Get pattern conversion statistics such as the number of vectors processed, compression ratios, scan chain and vector counts, and more. Available in Windows and Linux for both 32bit and 64bit operating systems.



VectorPort accepts WGL and STIL formatted test vectors as well as compressed versions of these files (*.gzip, *.zip). Convert parallel and serial SCAN vectors from many widely used ATPG tools, including FastScan and TetraMax. Import and edit large, broadside functional test vectors quickly and easily. Select several files at once and process them all with one click with batch-mode processing.



Generate patterns, timing, pinmaps and more for most of the ATE test platforms on the market, including many models from Teradyne, Advantest, Xcerra, and National Instruments STS. Each output writer has tester-specific options to ensure seamless integration and to enable and utilize important tester features and functions. Convert your STIL or WGL test vectors to VCD or EVCD using VectorPort and verify your test vectors in the design environment.


Scan Chains

Quickly convert your scan test vectors to production ATE patterns with VectorPort. Easily normalize different length scan chains and edit scan signal formats and timing. Automatically verify and condition scan vectors to ensure they meet the requirements of the target ATE platform. Flatten scan-formatted vectors into normal, broadside test vectors and run on non-scan equipped ATEs (no ATE scan license required).



VectorPort has several tools to help generate your ATE test vectors. Edit existing pins and signals in your STIL and WGL vectors or add new ones using the Signal Editor. Modify edges and formats or create new timing sets using the Timing Editor. Visualize your WGL and STIL test vectors in a logic-analyzer format with the graphical Waveform Viewer. Save modified signal and timing sessions and reuse them with other, similar pattern conversion projects.